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Modak, Sushrut ; Chernyak, Leonid ; Schulte, Alfons ; Sartel, Corinne ; Sallet, Vincent ; Dumont, Yves ; Chikoidze, Ekaterine ; Xia, Xinyi ; Ren, Fan ; Pearton, Stephen J. ; et al ( , APL Materials)Electron beam-induced current in the temperature range from 304 to 404 K was employed to measure the minority carrier diffusion length in metal–organic chemical vapor deposition-grown p-Ga 2 O 3 thin films with two different concentrations of majority carriers. The diffusion length of electrons exhibited a decrease with increasing temperature. In addition, the cathodoluminescence emission spectrum identified optical signatures of the acceptor levels associated with the V Ga − –V O ++ complex. The activation energies for the diffusion length decrease and quenching of cathodoluminescence emission with increasing temperature were ascribed to the thermal de-trapping of electrons from V Ga − –V O ++ defect complexes.more » « less
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Modak, Sushrut ; Chernyak, Leonid ; Schulte, Alfons ; Xian, Minghan ; Ren, Fan ; Pearton, Stephen J. ; Lubomirsky, Igor ; Ruzin, Arie ; Kosolobov, Sergey S. ; Drachev, Vladimir P. ( , Applied Physics Letters)
